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Hierarchical test pattern composition to testing a foveal imager ASIC

Research Area: Integrated Systems Year: 2003
Type of Publication: Proceedings
Authors: González García, Martín; Salinas Vázquez, José Ramón; Coslado Aristizabal, Francisco José; Camacho Lozano, Pelegrín; Sandoval Hernández, Francisco
BibTex:
Note:
mayo 2003

SPIEâ??s Conference on VLSI Circuits and System, part of the First International Symposium on Microtechnologies for the New Millennium, SPIE, vol. 5117, Maspalomas, Gran Canaria (Spain)
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