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Hierarchical test pattern composition to testing a foveal imager ASIC

BibTex:
Research Area:	Integrated Systems	Year:	2003
Type of Publication:	Proceedings
Authors:	González García, Martín; Salinas Vázquez, José Ramón; Coslado Aristizabal, Francisco José; Camacho Lozano, Pelegrín; Sandoval Hernández, Francisco






@proceedings{MGo/Hie/2003, author = "Gonz{\'a}lez Garc{\'i}a, Mart{\'i}n and Salinas V{\'a}zquez, Jos{\'e} Ram{\'o}n and Coslado Aristizabal, Francisco Jos{\'e} and Camacho Lozano, Pelegr{\'i}n and Sandoval Hern{\'a}ndez, Francisco", note = " mayo 2003 SPIE{\^a}??s Conference on VLSI Circuits and System, part of the First International Symposium on Microtechnologies for the New Millennium, SPIE, vol. 5117, Maspalomas, Gran Canaria (Spain)", title = "{H}ierarchical test pattern composition to testing a foveal imager {ASIC}", year = "2003", }
Note:	mayo 2003 SPIEâ??s Conference on VLSI Circuits and System, part of the First International Symposium on Microtechnologies for the New Millennium, SPIE, vol. 5117, Maspalomas, Gran Canaria (Spain)
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