Grupo ISIS

Grupo ISIS

Ingeniería de Sistemas IntegradoS

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Hierarchical test pattern composition to testing a foveal imager ASIC

Research Area: Integrated Systems Year: 2003
Type of Publication: Proceedings
Authors: González García, Martín; Salinas Vázquez, José Ramón; Coslado Aristizabal, Francisco José; Camacho Lozano, Pelegrín; Sandoval Hernández, Francisco
mayo 2003

SPIEâ??s Conference on VLSI Circuits and System, part of the First International Symposium on Microtechnologies for the New Millennium, SPIE, vol. 5117, Maspalomas, Gran Canaria (Spain)