Grupo ISIS
Ingeniería de Sistemas IntegradoS
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Hierarchical test pattern composition to testing a foveal imager ASIC
| Research Area: | Integrated Systems | Year: | 2003 | ||||
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| Type of Publication: | Proceedings | ||||||
| Authors: | González García, Martín; Salinas Vázquez, José Ramón; Coslado Aristizabal, Francisco José; Camacho Lozano, Pelegrín; Sandoval Hernández, Francisco | ||||||
| Note: | mayo 2003 SPIEâ??s Conference on VLSI Circuits and System, part of the First International Symposium on Microtechnologies for the New Millennium, SPIE, vol. 5117, Maspalomas, Gran Canaria (Spain) |
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